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Thermal Test

Designed to produce a temperature change in a device. The magnitude and rate of this change should induce a sufficient thermal stress fatigue to identify sources of potential failure without causing catastrophic failure of all components. (sigmasystems.com)

See Also: Thermal, Thermal Shock


Showing results: 196 - 210 of 240 items found.

  • High Definition MWIR Science-Grade Camera

    FLIR X8580™ - Teledyne FLIR

    The FLIR X8580 midwave IR camera is designed for scientists and engineers who need to capture detailed imagery of high-speed events, perform custom radiometric measurements, or detect points of failure in composites, solar cells, and electronics. This thermal imaging camera combines 1280 × 1024 HD resolution with fast frame rates and integration times, allowing researchers to record stop motion on fast-moving subjects or rapid temperature changes—whether in the lab or on the test range. With a four-position motorized filter wheel and support for FLIR motorized focus lenses, the X8580 will provide higher quality recordings, save time, and mitigate frustration in dynamic acquisition environments.

  • Analyzers and Timers

    CAT Advanced Series - Amperis sl

    Description The Advanced CAT Series Analyzers and Timers are stand-alone or PC-controlled digital instruments for circuit breaker status evaluation. Timing channels record arc closing and opening, resistance and auxiliary contacts. The main contact channels can also measure the resistance value of pre-insertion resistors (if present in the breaker). The advanced CAT series records graphs of the opening and closing coil currents and the movements of the moving parts of the high and medium voltage circuit breaker. Test results are printed on the 112 mm (4.4 inch) thermal printer (optional accessory) in tabular and graphical form. The advanced CAT series provides easy selection of different operating modes:

  • Caibration Equipment For Lab Use

    Ponovo Power Co., Ltd.

    In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.

  • DRAM Module Test

    NEOSEM TECHNOLOGY INC

    We provide our customers with Automated SLT (System Level Test) Solutions for DRAM Module HVM test. Our solution gives our customers the best possible combination of technologies for the best performances and manufacturing effiencies - increasing yield, reducing cost of ownership and accelerating time-to-market. The integrated system with CMB (custom designed Motherboard), Thermal subsystem and Automation technologies provides a Turn-key Automated Test System which reduces Integration risks and time to Volume Production. Our Automated DIMM SLT (System Level Test) System is highly configurable to address our customers needs and environments constraints for Best Cost of Ownership, Best Performance and shortest Time to Yield.

  • Temperature/Humidity Testing

    Quest Engineering Solutions

    Quest has 14 environmental chambers ranging in size from 1 cubic foot to over 1,000 cubic feet, covering temperatures from below -100C to temperatures exceeding 200C. Our temperature/humidity test chambers include one of the largest walk-in chambers (15 x 10 x 8 ft) in New England, table top, high humidity, thermal shock, and high ramp rate test chambers. We can provide a wide range of temperature/humidity conditions on a variety of different product shapes and sizes, from extremely small to large products.

  • Non-Destructive Testing (NDT)

    Marposs S.p.A.

    Marposs complements its geometric measurement solutions with solutions for non-destructive testing using eddy current technology.The testing options can be divided in three large groups:Material integrity test, to check for the presence of defects (cracks, porosity, blow holes, inclusions) on the surface and in the layer just below the surface.Material properties test, to check if the thermal cycles (hardening, hardening and tempering, annealing, stress relieving, etc.) have been performed correctly. Material identification checks are done to sort parts with the same geometry but made with different materials.Thread inspection to check if the treading has been carried out and its quality.In addition to the non-destructive checks performed with the eddy currents, we have developed a durometer for the conventional measurement of surface hardness, according to the Rockwell scale (HRC or HRA); which uses a diamond penetrator to measure the hardness of the sample being tested.

  • Measurement System For Testing & Binning Of Back-End LEDs

    TP121-TH - Gigahertz-Optik GmbH

    The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.

  • Dynamic Micro Ohm Meter

    PRIME 200 - EUROSMC, S.A.

    It is the only micro ohm meter in the market that integrates both the contact resistance and the dynamic resistance measurement (DRM) for cost-efficient condition evaluation of contacts in SF6 and vacuum type circuit breakers; PRIME is a high current micro-ohmmeter that provides true pure DC with smart control up to 200 A, a wide measurement range with high power, dual ground testing process, thermal printer, touch display, pre-defined test modes and automatic reporting.

  • Dynamic Micro Ohm Meter

    PRIME 600 - EUROSMC, S.A.

    It is the only micro ohm meter in the market that integrates both the contact resistance and the dynamic resistance measurement (DRM) for cost-efficient condition evaluation of contacts in SF6 and vacuum type circuit breakers; PRIME is a high current micro-ohmmeter that provides true pure DC with smart control up to 600 A, a wide measurement range with high power, dual ground testing process, thermal printer, touch display, pre-defined test modes and automatic reporting.

  • PXI-2568, 31-Channel, 2 A, SPST PXI Relay Module

    778572-68 - NI

    31-Channel, 2 A, SPST PXI Relay Module—The PXI‑2568 is a general-purpose switch module that features independent single‑pole single‑throw (SPST) Form A armature relays. Each relay is nonlatching with very low on-resistance and low thermal offsets. The PXI‑2568 is fully software programmable. With an efficient coupling of voltage/current capability and relay density, this switch module is ideal for automated test equipment (ATE) loads or for controlling heaters, lights, and fans.

  • Astronics PXIe-6943, 1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument

    785855-01 - NI

    1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.

  • Round Wire Coil Inductors

    Pulse Electronics

    Round wire coil (RWC) inductors come in six platform sizes and enable the highest efficiency of any SMT inductor through the use of a low loss ferrite core material which minimizes AC losses and also eliminates thermal ageing.   The use of round magnetic wire instead of rectangular flat coils enables a lower cost while still maintaining a low DCR and small footprint.   The platforms have passed the AEC-Q200 stress test qualification proving the designs robustness and suitability to difficult environments but the parts are not IATF certified.  The platform range from 7.6×7.4×6.4mm to 26x26x15mm and are suitable for a wide range of applications and markets including communications, computing and industrial.

  • Autocompute LCR-Q Meter Sorter

    Model 4912 / 4912PR - Aplab Limited

    - Microprocessor based Fully Automatic L, C, R, Q and D measurement- Autoranging with Direct Digital Readout- 4 Terminal Measurement Technique- No Tuning or Balancing- Series or Parallel Equivalent Measurement- Absolute Value and Nominal Value with Percentage Tolerance- Single / Multiple Parameters Check During Component Sorting- Feather Touch Keys with Audio Feedback- Thermal Shut Down for Overheat Protection- Special Mechanism for Fast and Easy Insertion and Removal of Test Component- Low Cost and Portable- Component Sorting on Absolute or Nominal Value Basis with a Percentage Tolerance- Aplab Model 4912PR is Remote Programmable Auto Compute LCR-Q Meter Sorter, Which can be Programmed through GPIB, RS232 or SPIB Interface

  • PXI-2564 , 16-Channel, 5 A, SPST PXI Relay Module

    PXI-2564 / 778572-64 - NI

    16-Channel, 5 A, SPST PXI Relay Module—The PXI‑2564 is a general-purpose switch module that features independent single‑pole single‑throw (SPST) Form A armature relays. Each relay is nonlatching with very low on-resistance and low thermal offsets. The PXI‑2564 is fully software programmable. With an efficient coupling of voltage/current capability and relay density, this switch module is ideal for switching medium‑ to high‑power signals and loads in military, automotive, or automated test applications.

  • Rapid Temperature Change Test Chamber

    Sanwood Environmental Chambers Co ., Ltd.

    Sanwood is the company capable of offering a series of Rapid ESS Test Chamber,Rapid Temperature Change Test Chamber,Environmental stress screening (ESS) test chamber,Environmental stress screening test chamber,Temperature Change Test ChamberEnergy-saving design: Adopting PID + PWM principle of VRF (refrigerant flow control) technology to achieve low-temperature energy-saving operation (electronic expansion valve according to thermal energy conditions refrigerant flow servo control technology) low temperature working state, the heater does not participate in the work, through PID + The PWM regulates the flow rate and flow direction of the refrigerant, and regulates the three-way flow of the refrigerant pipe, the cold bypass pipe, and the hot bypass pipe to achieve automatic constant temperature to the working chamber. This method can reduce energy consumption by 30% under low temperature conditions.

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